Title: UMR7361-JEOLARM200
Technic: Transmission Electron Microscopy
Unit ID: UMR7361
Instrument ID: TEM-JEOL ARM 200
Manufacturer: JEOL (Japan Electron Optics Laboratory)
Energy Dispersive Spectroscopy: Classical SDD,
Plt Name: Microscopies électroniques
Source: Side
Scanning Transmission Electron Microscopy (STEM) Modes: BF (Bright Field), HAADF (High Angle Annular Dark Field Imaging),
Source: Cold FEG (Cold Field Emission Gun
Options: EM Image Corrector,
Voltage: 200,
Maxres: 0.1
Instrument IDs: Analyse chimique,
Electron Diffraction (ED) Modes: SAED (Selected Area Electron Diffraction,
Sample Holder
Options: UMR7361-JEOLARM200-Sample Holder (5 tools)
Tilt: Double, Simple,
Options: TEM-JEOL ARM 200 - Sample Holder
Options: Analytical, Tomography, Vacuum Transfer,
Camera
Sharelink: UMR7361-JEOLARM200-Gatan ORIUS 1000
Type: CCD
Detection Mode: TEM-JEOL ARM 200 - Gatan Orius 1000
Detection Mode: Direct electron detection
Name: Orius 1000
Sensor Width: 11000,
Manufacturer: Gatan
Sensor Height: 1,
Software: Gatan DigitalMicrograph (DM),
Corrector
Options: UMR7361-JEOLARM200-Correcteur de lentille objectif
Model: JEOL
Options: TEM-JEOL ARM 200-Corrector
Name: JEOL
Type: Image
Title: UMR7361-JEOL7900F
Technic: Scanning Electron Microscopy
Unit ID: UMR7361
Instrument ID: SEM-JEOL7900F
Source: Low Vacuum (LV) i.e. Variable Pressure (VP)
Manufacturer: JEOL (Japan Electron Optics Laboratory)
Source: High Vaccum
Plt Name: Microscopies électroniques
Chem Analysis Type: Plasma Cleaner,
Resolution Max: 0.9
Source: FEG Gun hot cathode (Schottky)
Imaging Mode: Low voltage Mode, High Resolution Mode, Backscattered Electron Mode (BSE), Standard Mode (deep depth of field),
Detector Type: HV InLens Detector, HV BackScattered Electron Detector (BSE), HV Secondary Electron Detector (SE-Everhard-Thornley), HV Scanning Transmission Electron Microscope Detector (STEM),
Instrument IDs: Analyse chimique ,
Voltage Min: 0.1
Voltage Max: 15
Voltage Min: 1
Voltage Max: 30
Resolution Max: 0.5
Resolution Max: 0.6
Detector Type: CP BackScattered Electron Detector (BSE), CP Secondary Electron Detector (SE-Everhard-Tornley),
Chem Analysis Type: Energy Dispersive X Ray Spectroscopy (EDX) SDD Detector,