Title: MIC_SEM_CARL ZEISS Merlin
Technic: Scanning Electron Microscopy
Unit ID: UMR7182
Instrument ID: CARL ZEISS Merlin
Source: Classical SEM
Manufacturer: Carl Zeiss Microscopy
Source: High Vaccum
Plt Name: MIC ICMPE
Resolution Max: 1.4
Source: FEG Gun hot cathode (Schottky)
Imaging Mode: Low voltage Mode, High Resolution Mode, Backscattered Electron Mode (BSE), Standard Mode (deep depth of field),
Detector Type: HV InLens Detector, HV BackScattered Electron Detector (BSE), HV Electron BackScattered Diffraction Detector (EBSD), HV Secondary Electron Detector (SE-Everhard-Thornley),
Voltage Min: 0.2
Voltage Max: 15
Voltage Max: 30
Resolution Max: 0.8
Chem Analysis Type: Energy Dispersive X Ray Spectroscopy (EDX) SDD Detector,
Title: TEM_MIC_JEOL 2000EX - Main
Technic: Transmission Electron Microscopy
Unit ID: UMR7182
Instrument ID: TEM_MIC_JEOL 2000EX
Manufacturer: JEOL (Japan Electron Optics Laboratory)
Plt Name: MIC IPCME
Source: Side
Source: LaB6 Gun
Voltage: 200,
Maxres: 0.25
Electron Diffraction (ED) Modes: SAED (Selected Area Electron Diffraction,
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet traction
Tilt: Simple,
Options: Strain,
Options: TEM_MIC_JEOL 2000EX
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet refroidissant
Options: Cooled,
Tilt: Double,
Options: TEM_MIC_JEOL 2000EX
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet chauffant
Tilt: Double, Rotating,
Options: Heating,
Options: TEM_MIC_JEOL 2000EX
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet simple tilt rotation
Tilt: Simple, Rotating,
Options: TEM_MIC_JEOL 2000EX
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet double tilt
Tilt: Double,
Options: TEM_MIC_JEOL 2000EX
Sample Holder
Options: TEM_MIC_JEOL 2000EX - Porte-objet simple tilt
Tilt: Simple,
Options: TEM_MIC_JEOL 2000EX
Camera
Sharelink: TEM_MIC_JEOL 2000EX - camera GATAN Erlangshen ES500
Type: CCD
Detection Mode: TEM_MIC_JEOL 2000EX
Name: Erlangshen ES500
Sensor Width: 1.35,
Manufacturer: Gatan
Sensor Height: 1.04,
Software: GMS (Gatan Microscopy Suite),
Title: MIC_EPMA_ CAMECA SX100 - main
Technic: Scanning Electron Microscopy
Unit ID: UMR7182
Instrument ID: EPMA - CAMECA SX100
Source: High Vaccum
Plt Name: MIC ICMPE
Source: Tungsten Filament
Voltage Max: 40
Imaging Mode: Backscattered Electron Mode (BSE),
Detector Type: HV BackScattered Electron Detector (BSE), HV Secondary Electron Detector (SE-Everhard-Thornley),
Chem Analysis Type: Wavelength Dispersive X Ray Spectroscopy (WDS) ,
Title: MIC_TEM_FEI TECNAI F20 - main
Technic: Transmission Electron Microscopy
Unit ID: UMR7182
Instrument ID: TEM-FEI TECNAI F20
Manufacturer: FEI Company (Thermo Fisher Scientific)
Energy Dispersive Spectroscopy: Classical SDD,
Plt Name: MIC ICMPE
Source: Side
Scanning Transmission Electron Microscopy (STEM) Modes: BF (Bright Field), ADF (Annular Dark Field), ABF (Annular Bright Field), HAADF (High Angle Annular Dark Field Imaging),
Source: Schottky FEG (Schottky Field Emission Gun
Voltage: 200, 80,
Maxres: 0.24
Electron Precession: Desorientation mapping, Structure Determination,
Electron Diffraction (ED) Modes: NBD (Nano Beam Diffraction), SAED (Selected Area Electron Diffraction, CBD (Convergent Beam Electron Diffraction),
Energy Filtering - EELS type: Bottom-mounted Energy Loss Spectrometer and Filtered Imaging - GIF,
Camera
Sharelink: MIC_TEM_FEI TECNAI F20 - camera GATAN ORIUS 1000
Type: CCD
Detection Mode: TEM-FEI TECNAI F20
Detection Mode: Image sensor
Name: ORIUS 1000
Sensor Width: 4.008,
Manufacturer: Gatan
Detection Mode: Scintillator,
Sensor Height: 2.672,
Software: GMS (Gatan Microscopy Suite),
Camera
Sharelink: MIC_TEM_FEI TECNAI F20 - camera GATAN GIF Quantum ER
Type: CCD
Detection Mode: TEM-FEI TECNAI F20
Detection Mode: Image sensor
Name: GIF Quantum ER
Sensor Width: 2.048,
Manufacturer: Gatan
Detection Mode: Scintillator,
Sensor Height: 2.048,
Software: GMS (Gatan Microscopy Suite),
Sample Holder
Options: MIC_TEM_FEI TECNAI F20 - Liste des porte-objets
Options: Cooled, Strain, Heating, Analytical, Tomography, Cryo-Transfer, Cryo-Tomograty, Vacuum Transfer, Multiple Specimen Sample,
Tilt: Double, Simple,
Options: TEM-FEI TECNAI F20
Options: Temperature Controled Electrical Measurements ,