Title: HELIOS NanoLab600i
Applications: Etching, Tomography, 3D Reconstruction, TEM Sample Preparation, Nano Objects Fabrication (Micro Machining),
Technic: Focused Ion Beam
Unit ID: UAR3623
Instrument ID: FIB_Helios_NanoLab600i
Source: Gallium (Ga),
Manufacturer: FEI Company (Thermo Fisher Scientific)
Plt Name: Centre Raimond CASTAING
Instrument IDs: SEM_Helios_NanoLab600i,
accessories: Ion Beam Induced Deposition (IBID), Electron Beam Induced Deposition (EBID),